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X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals
Terekhov, V. A., Tetelbaum, D. I., Spirin, D. E., Pankov, K. N., Mikhailov, A. N., Belov, A. I., Ershov, A. V., Turishchev, S. Yu.Volume:
21
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/S1600577513030026
Date:
January, 2014
File:
PDF, 516 KB
english, 2014