X-ray absorption near-edge structure anomalous behaviour in...

X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals

Terekhov, V. A., Tetelbaum, D. I., Spirin, D. E., Pankov, K. N., Mikhailov, A. N., Belov, A. I., Ershov, A. V., Turishchev, S. Yu.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
21
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/S1600577513030026
Date:
January, 2014
File:
PDF, 516 KB
english, 2014
Conversion to is in progress
Conversion to is failed