Comparison of the Crystallization Behaviors in As-Deposited...

Journal of The Electrochemical Society 2011 Vol. 158; Iss. 4

Comparison of the Crystallization Behaviors in As-Deposited and Melt-Quenched N-Doped Ge2Sb2Te5 Thin Films

Do, Kihoon, Lee, Dokyu, Bae, Jun-Hyun, Ko, Dae-Hong, Sohn, Hyunchul, Cho, Mann-Ho
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Volume:
158
Year:
2011
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.3543927
File:
PDF, 2.94 MB
english, 2011
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