![](/img/cover-not-exists.png)
Optical characterization of multi-layer thin films using the surface plasmon resonance method: A six-phase model based on the Kretschmann formalism
D. RoyVolume:
200
Year:
2001
Language:
english
Pages:
12
DOI:
10.1016/s0030-4018(01)01661-3
File:
PDF, 156 KB
english, 2001