Optical characterization of multi-layer thin films using...

Optical characterization of multi-layer thin films using the surface plasmon resonance method: A six-phase model based on the Kretschmann formalism

D. Roy
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Volume:
200
Year:
2001
Language:
english
Pages:
12
DOI:
10.1016/s0030-4018(01)01661-3
File:
PDF, 156 KB
english, 2001
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