Probing the nature and resistance of the molecule–electrode contact in SAM-based junctions
Suchand Sangeeth, C. S., Wan, Albert, Nijhuis, Christian A.Volume:
7
Year:
2015
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C5NR02570B
File:
PDF, 985 KB
english, 2015