Influences on relaxation of exchange biasing in NiO/Ni[sub 66]Co[sub 18]Fe[sub 16] bilayers
van der Heijden, P. A. A., Maas, T. F. M. M., Kools, J. C. S., Roozeboom, F., van der Zaag, P. J., de Jonge, W. J. M.Volume:
83
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.367549
File:
PDF, 415 KB
english, 1998