High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM
Whitby, James A., Östlund, Fredrik, Horvath, Peter, Gabureac, Mihai, Riesterer, Jessica L., Utke, Ivo, Hohl, Markus, Sedláček, Libor, Jiruše, Jaroslav, Friedli, Vinzenz, Bechelany, Mikhael, Michler, JVolume:
2012
Year:
2012
Language:
english
Journal:
Advances in Materials Science and Engineering
DOI:
10.1155/2012/180437
File:
PDF, 1.52 MB
english, 2012