Integrity Profiling of High Throughput Screening Hits Using LC-MS and Related Techniques
Edward H. Kerns, Bentham Science Publisher, Li Di, Bentham Science Publisher, Jim Bourassa, Bentham Science Publisher, Jonathan Gross, Bentham Science Publisher, Nelson Huang, Bentham Science PublisheVolume:
8
Language:
english
Journal:
Combinatorial Chemistry & High Throughput Screening
DOI:
10.2174/1386207054867283
Date:
September, 2005
File:
PDF, 92 KB
english, 2005