2 keV Ga+ FIB Milling for Reducing Amorphous Damage in...

2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon

Giannuzzi, L A, Geurts, R, Ringnalda, J
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927605507797
Date:
August, 2005
File:
PDF, 958 KB
english, 2005
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