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SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Portable profilometer based on low-coherence interferometry and smart pixel camera
Salbut, Leszek, Pakuła, Anna, Tomczewski, Sławomir, Styk, Adam, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.871532
File:
PDF, 2.26 MB
english, 2010