Visual inspection system for the classification of solder joints
Tae-Hyeon Kim, Tai-Hoon Cho, Young Shik Moon, Sung Han ParkVolume:
32
Year:
1999
Language:
english
Pages:
11
DOI:
10.1016/s0031-3203(98)00103-4
File:
PDF, 620 KB
english, 1999