SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) -...

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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Intelligent Systems in Design and Manufacturing - Machine-vision-based bar code scanning for long-range applications

Banta, Larry E., Pertl, Franz A., Rosenecker, Charles, Rosenberry-Friend, Kimberly A., Gopalakrishnan, Bhaskaran, Murugesan, San
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Volume:
3517
Year:
1998
Language:
english
DOI:
10.1117/12.326917
File:
PDF, 2.14 MB
english, 1998
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