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Simulation of Capacitance-Voltage characteristics of Ultra-thin Metal-Oxide-Semiconductor Structures with Embedded Nanocrystals
Rahman, Mosur, Lojek, Bo, Kalkur, ThottamVolume:
1071
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1071-F02-11
Date:
January, 2008
File:
PDF, 345 KB
english, 2008