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[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Physical Characterization of Zinc Oxide Thin Films Grown by ALD
Tapily, Kandabara, Stegall, David, Gu, Diefeng, Baumgart, Helmut, Namkoong, Gon, Elmustafa, AbdelmageedYear:
2009
Language:
english
DOI:
10.1149/1.3205045
File:
PDF, 745 KB
english, 2009