Synchrotron-based X-ray Tomographic Microscopy at the Swiss...

Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications

Marone, F., Mokso, R., Fife, J.L., Irvine, S., Modregger, P., Pinzer, B.R., Mader, K., Isenegger, A., Mikuljan, G., Stampanoni, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
24
Language:
english
Journal:
Synchrotron Radiation News
DOI:
10.1080/08940886.2011.634315
Date:
November, 2011
File:
PDF, 2.27 MB
english, 2011
Conversion to is in progress
Conversion to is failed