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Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications
Marone, F., Mokso, R., Fife, J.L., Irvine, S., Modregger, P., Pinzer, B.R., Mader, K., Isenegger, A., Mikuljan, G., Stampanoni, M.Volume:
24
Language:
english
Journal:
Synchrotron Radiation News
DOI:
10.1080/08940886.2011.634315
Date:
November, 2011
File:
PDF, 2.27 MB
english, 2011