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Investigation of the High Frequency Properties of BST Thin Films--A Comparison of Three Different Commonly Used Methods
Tappe, S., Bö, ttger, U., Waser, R.Volume:
53
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580390258624
Date:
June, 2003
File:
PDF, 174 KB
english, 2003