The Effect of Fixed Oxide Charge in Al[sub 2]O[sub 3]...

Electrochemical and Solid-State Letters 2006 Vol. 9; Iss. 8

The Effect of Fixed Oxide Charge in Al[sub 2]O[sub 3] Blocking Dielectric on Memory Properties of Charge Trap Flash Memory Devices

Jeon, Sanghun, Kim, Chungwoo
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Volume:
9
Year:
2006
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.2206882
File:
PDF, 206 KB
english, 2006
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