Optimising pseudo-random built-in self-testing of fully synchronous as well as multisynchronous networks-on-chip
Bertozzi, Davide, Terenzi, Simone, Caselli, Nicola, Strano, AlessandroVolume:
7
Language:
english
Journal:
IET Computers & Digital Techniques
DOI:
10.1049/iet-cdt.2012.0064
Date:
March, 2013
File:
PDF, 738 KB
english, 2013