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SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Thermosense: Thermal Infrared Applications XXXVII - Measurement of flaw size from thermographic data
Hsieh, Sheng-Jen (Tony), Zalameda, Joseph N., Winfree, William P., Zalameda, Joseph N., Howell, Patricia A.Volume:
9485
Year:
2015
Language:
english
DOI:
10.1117/12.2176292
File:
PDF, 655 KB
english, 2015