The use of the focused ion beam technique to prepare...

Polymer 2002 Vol. 43; Iss. 26

The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

Joachim Loos, Jeroen K.J van Duren, Francis Morrissey, René A.J Janssen
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Volume:
43
Year:
2002
Language:
english
Pages:
4
DOI:
10.1016/s0032-3861(02)00643-2
File:
PDF, 710 KB
english, 2002
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