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Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films
G. Evmenenko, M.E. van der Boom, C.-J. Yu, J. Kmetko, P. DuttaVolume:
44
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0032-3861(02)00900-x
File:
PDF, 165 KB
english, 2003