Specular X-ray reflectivity analysis of adhesion...

Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

G. Evmenenko, M.E. van der Boom, C.-J. Yu, J. Kmetko, P. Dutta
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
44
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0032-3861(02)00900-x
File:
PDF, 165 KB
english, 2003
Conversion to is in progress
Conversion to is failed