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SPIE Proceedings [SPIE Optical Engineering and Photonics in Aerospace Sensing - Orlando, FL (Sunday 11 April 1993)] Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision - Model-based feature extraction
Mueller, Walter J., Olson, James A., Barrett, Eamon B., McKeown, Jr., David M.Volume:
1944
Year:
1993
Language:
english
DOI:
10.1117/12.155811
File:
PDF, 965 KB
english, 1993