SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Engineered Nanostructural Films and Materials - Lithographically patterned superconductor bolometer detectors for visible and near-infrared radiation incorporating wavelength-selective light-absorbing elements
Eames, Sara J., Yoo, J. S., Warner, John C., Neikirk, Dean P., McDevitt, John T., Lakhtakia, Akhlesh, Messier, Russell F.Volume:
3790
Year:
1999
Language:
english
DOI:
10.1117/12.351247
File:
PDF, 540 KB
english, 1999