SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Light-Emitting Diodes: Research, Manufacturing, and Applications II - Life tests and failure mechanisms of GaN/AlGaN/InGaN light-emitting diodes
Barton, Daniel L., Osinski, Marek, Perlin, Piotr, Helms, Christopher J., Berg, Niel H., Schubert, E. F.Volume:
3279
Year:
1998
Language:
english
DOI:
10.1117/12.304426
File:
PDF, 935 KB
english, 1998