Dynamic variability in 14nm FD-SOI MOSFETs and transient...

Solid-State Electronics 2015 / 09 Vol. 111

Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Dimitriadis, Charalabos A., Ghibaudo, Gerard
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Volume:
111
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2015.06.001
Date:
September, 2015
File:
PDF, 841 KB
english, 2015
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