Research of Single-Event Burnout in Power Planar VDMOSFETs...

IEEE Transactions on Electron Devices 2015 / 1 Vol. 62; Iss. 1

Research of Single-Event Burnout in Power Planar VDMOSFETs by Localized Carrier Lifetime Control

Yu, Cheng-Hao, Wang, Ying, Cao, Fei, Huang, Li-Lian, Wang, Yu-Ye
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2365817
Date:
January, 2015
File:
PDF, 1.13 MB
english, 2015
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