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Highly reliable operation of 660 nm visible laser diodes at high temperatures
Ohgoh, T., Mukai, A., Mukaiyama, A., Asano, H., Hayakawa, T.Volume:
42
Year:
2006
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20061859
File:
PDF, 276 KB
english, 2006