Highly reliable operation of 660 nm visible laser diodes at...

Highly reliable operation of 660 nm visible laser diodes at high temperatures

Ohgoh, T., Mukai, A., Mukaiyama, A., Asano, H., Hayakawa, T.
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Volume:
42
Year:
2006
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20061859
File:
PDF, 276 KB
english, 2006
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