![](/img/cover-not-exists.png)
Full∕partial depletion effects in FinFETs
Xiong, W., Rinn Cleavelin, C., Wise, R., Yu, S., Pas, M., Zaman, R.J., Gostkowski, M., Matthews, K., Maleville, C., Patruno, P., King, T.-J., Colinge, J.P.Volume:
41
Year:
2005
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20050281
File:
PDF, 92 KB
english, 2005