X-Ray Characterization and Domain Structure of High-Quality...

Integrated Ferroelectrics 2004 / 01 Vol. 68; Iss. 1

X-Ray Characterization and Domain Structure of High-Quality SrBi 2 Ta 2 O 9 Single-Crystals Grown by Self-Flux Solution Method

AMORÍN, HARVEY, BDIKIN, IGOR K., SHVARTSMAN, VLADIMIR V., COSTA, M. ELISABETE V., KHOLKIN, ANDREI L.
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Volume:
68
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580490896616
Date:
January, 2004
File:
PDF, 1.38 MB
english, 2004
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