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X-Ray Diffraction: New Eyes on the Process
Anderson, Jennifer, Gobbo, Luciano de Andrade, van Weeren, HaraldVolume:
51
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2014.2350557
Date:
January, 2015
File:
PDF, 1.22 MB
english, 2015