SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Small- and large-signal trap-assisted GR noise modeling in semiconductor devices
Donati Guerrieri, Simona, Conte, Gabriele, Bonani, Fabrizio, Ghione, Giovanni, Danneville, Francois, Bonani, Fabrizio, Deen, M. Jamal, Levinshtein, Michael E.Volume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.547063
File:
PDF, 616 KB
english, 2004