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Measuring dislocation densities in nonpolar a -plane GaN films using atomic force microscopy
Moram, M A, Johnston, C F, Kappers, M J, Humphreys, C JVolume:
43
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/43/5/055303
Date:
February, 2010
File:
PDF, 722 KB
english, 2010