Measuring dislocation densities in nonpolar...

Measuring dislocation densities in nonpolar a -plane GaN films using atomic force microscopy

Moram, M A, Johnston, C F, Kappers, M J, Humphreys, C J
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/43/5/055303
Date:
February, 2010
File:
PDF, 722 KB
english, 2010
Conversion to is in progress
Conversion to is failed