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Analyzing degradation effects of organic light-emitting diodes via transient optical and electrical measurements
Schmidt, Tobias D., Jäger, Lars, Noguchi, Yutaka, Ishii, Hisao, Brütting, WolfgangVolume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4921829
Date:
June, 2015
File:
PDF, 1.75 MB
english, 2015