Characterization of aluminium concentration in shallow quantum wells AlxGa1−xAs/GaAs types
M Chaouache, R Chtourou, F.F Charfi, J Yves Marzin, J BlochVolume:
125
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0038-1098(02)00598-7
File:
PDF, 150 KB
english, 2003