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Observation of deviation of electronic behaviour of indium tin oxide film at grain boundary using Scanning Tunneling Microscope
S Kasiviswanathan, V Srinivas, A.K Kar, B.K Mathur, K.L ChopraVolume:
101
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0038-1098(96)00684-9
File:
PDF, 533 KB
english, 1997