Observation of deviation of electronic behaviour of indium...

Observation of deviation of electronic behaviour of indium tin oxide film at grain boundary using Scanning Tunneling Microscope

S Kasiviswanathan, V Srinivas, A.K Kar, B.K Mathur, K.L Chopra
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
101
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0038-1098(96)00684-9
File:
PDF, 533 KB
english, 1997
Conversion to is in progress
Conversion to is failed