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Microstructural Evolution of Radiation-Induced Defects in Semi-Insulating SiC During Isochronal Annealing
Puff, Werner, Balogh, Adam G., Mascher, PeterVolume:
338-342
Year:
2000
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.338-342.965
File:
PDF, 318 KB
2000