Structural inhomogeneities in amorphous silicon layers...

Solid State Communications 1999 Vol. 110; Iss. 6

Structural inhomogeneities in amorphous silicon layers observed by X-ray diffraction and Raman scattering

H. Touir, J.-F. Morhange, J. Dixmier
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Volume:
110
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0038-1098(99)00078-2
File:
PDF, 210 KB
english, 1999
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