Hot-carrier reliability of ultra-thin gate oxide CMOS

Solid-State Electronics 2000 Vol. 44; Iss. 11

Hot-carrier reliability of ultra-thin gate oxide CMOS

Hisayo Sasaki Momose, Shin-ichi Nakamura, Tatsuya Ohguro, Takashi Yoshitomi, Eiji Morifuji, Toyota Morimoto, Yasuhiro Katsumata, Hiroshi Iwai
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Volume:
44
Year:
2000
Language:
english
Pages:
10
DOI:
10.1016/s0038-1101(00)00101-5
File:
PDF, 236 KB
english, 2000
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