Breakdown mechanism of Al2O3 based metal-to-metal antifuses

Solid-State Electronics 2000 Vol. 44; Iss. 9

Breakdown mechanism of Al2O3 based metal-to-metal antifuses

Wei-Tang Li, David R McKenzie, William D McFall, Qi-Chu Zhang, Witold Wiszniewski
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Volume:
44
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(00)00125-8
File:
PDF, 115 KB
english, 2000
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