A new way for measuring the apparent band gap narrowing in...

Solid-State Electronics 2000 Vol. 44; Iss. 12

A new way for measuring the apparent band gap narrowing in bipolar transistors

Jin Haiyan, Zhang Lichun
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Volume:
44
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0038-1101(00)00196-9
File:
PDF, 120 KB
english, 2000
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