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Effect of N2 plasma treatments on dry etch damage in n- and p-type GaN
D.G Kent, K.P Lee, A.P Zhang, B Luo, M.E Overberg, C.R Abernathy, F Ren, K.D Mackenzie, S.J Pearton, Y NakagawaVolume:
45
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0038-1101(01)00016-8
File:
PDF, 92 KB
english, 2001