![](/img/cover-not-exists.png)
Temperature effect on gate leakage currents in gate dielectric films of GaAs MOSFET
Jau-Yi Wu, Po-Wen Sze, Yeong-Her Wang, Mau-Phon HoungVolume:
45
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0038-1101(01)00216-7
File:
PDF, 166 KB
english, 2001