The role of interface states and series resistance on the I–V and C–V characteristics in Al/SnO2/p-Si Schottky diodes
Ş. Altındal, S. Karadeniz, N. Tuğluoğlu, A. TataroğluVolume:
47
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0038-1101(03)00182-5
File:
PDF, 184 KB
english, 2003