Recrystallization and dielectric properties of CaHfOx films...

Recrystallization and dielectric properties of CaHfOx films on Si

Y.W. Kwon, D.P. Norton, G.E. Jellison Jr.
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Volume:
47
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0038-1101(03)00188-6
File:
PDF, 379 KB
english, 2003
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