Dielectric properties of Fe-doped BaxSr1−xTiO3 thin films on polycrystalline substrates at temperatures between −35 and +85 °C
M. Lorenz, H. Hochmuth, M. Schallner, R. Heidinger, D. Spemann, M. GrundmannVolume:
47
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0038-1101(03)00197-7
File:
PDF, 276 KB
english, 2003