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XPS measurement of valence band discontinuity at GaP/GaN heterointerfaces
Hisao Sato, Mihir Ranjan Sarkar, Yoshiki Naoi, Shiro SakaiVolume:
41
Year:
1997
Language:
english
Pages:
3
DOI:
10.1016/s0038-1101(96)00167-0
File:
PDF, 205 KB
english, 1997