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Creation and passivation of interface traps in irradiated MOS transistors during annealing at different temperatures
Momčilo Pejović, Goran RistićVolume:
41
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(96)00252-3
File:
PDF, 574 KB
english, 1997