Analysis of the hot-carrier degradation of...

Analysis of the hot-carrier degradation of deep-submicrometer large-angle-tilt-implanted drain (LATID) MOSFETs

A. Bravaix, D. Vuillaume
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
41
Year:
1997
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(97)00074-9
File:
PDF, 995 KB
english, 1997
Conversion to is in progress
Conversion to is failed