Low-frequency noise characteristics of hot carrier-stressed...

Low-frequency noise characteristics of hot carrier-stressed buried-channel pMOSFETs

Sheng-Lyang Jang, Heng-Kuen Chen, Kow-Ming Chang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
42
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0038-1101(97)00209-8
File:
PDF, 611 KB
english, 1998
Conversion to is in progress
Conversion to is failed