![](/img/cover-not-exists.png)
Low-frequency noise characteristics of hot carrier-stressed buried-channel pMOSFETs
Sheng-Lyang Jang, Heng-Kuen Chen, Kow-Ming ChangVolume:
42
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0038-1101(97)00209-8
File:
PDF, 611 KB
english, 1998