Influence of electron scattering on current instability in field effect transistors
M.V. Cheremisin, M.I. Dyakonov, M.S. Shur, G. SamsonidzeVolume:
42
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(98)00133-6
File:
PDF, 279 KB
english, 1998