Analysis of transition region and accumulation layer effect...

Analysis of transition region and accumulation layer effect in the subthreshold slope in SOI nMOSFETs and their influences on the interface trap density extraction

Victor Sonnenberg, João Antonio Martino
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Volume:
43
Year:
1999
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(99)00191-4
File:
PDF, 221 KB
english, 1999
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